• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文学位 >The Role of Recoverable and Non-Recoverable Defects in DC Electrical Aging of Highly Disordered Insulating Materials
【24h】

The Role of Recoverable and Non-Recoverable Defects in DC Electrical Aging of Highly Disordered Insulating Materials

机译：可恢复和不可恢复缺陷在高度无序绝缘材料的直流电老化中的作用

获取原文
获取原文并翻译 | 示例
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Electrical insulation under high voltage can eventually fail, causing critical damage to electronics. Such electrostatic discharge (ESD) is the primary source of anomalies or failures on spacecraft due to charged particles from the Sun or planetary radiation belts accumulating in spacecraft insulators. High-voltage direct current power distribution is another example of a growing industry that needs to estimate the operational lifetime of electrical insulation. My research compares laboratory tests of ESD events in common insulating materials to a physics-based model of breakdown. This model of breakdown is based on the approximation that there are two primary types of defects in structurally amorphous insulators. One of the two defect modes can switch on and off depending on the material temperature. This dual-defect model can be used to explain both ESD and less-destructive transient partial discharges. I show that the results of ESD tests agree reasonably well with the dual defect model. I also show that transient partial discharges, which are usually ignored during ESD tests, are closely related to the probability of catastrophic ESD occurring. Since many partial discharges are typically seen during one ESD test, this relationship suggests that the measurements of partial discharges could accelerate the testing needed to characterize the likelihood of ESD in insulating materials.
机译：高压下的电绝缘最终可能会失效，从而严重损坏电子设备。由于来自太阳的带电粒子或行星辐射带积聚在航天器绝缘子中，这种静电放电（ESD）是航天器异常或故障的主要来源。高压直流配电是不断发展的行业的另一个示例，该行业需要估计电气绝缘的使用寿命。我的研究将普通绝缘材料中ESD事件的实验室测试与基于物理的击穿模型进行了比较。这种击穿模型基于以下近似值：在结构上无定形绝缘子中存在两种主要类型的缺陷。两种缺陷模式之一可以根据材料温度打开和关闭。这种双缺陷模型可用于解释ESD和破坏性较小的瞬态局部放电。我证明ESD测试的结果与双重缺陷模型相当吻合。我还表明，在ESD测试中通常会忽略瞬态局部放电，这与发生灾难性ESD的可能性密切相关。由于在一个ESD测试中通常会看到许多局部放电，因此这种关系表明，局部放电的测量可以加快表征绝缘材料中ESD可能性所需的测试。

著录项

  • 作者

    Andersen, Allen.;

  • 作者单位

    Utah State University.;

  • 授予单位 Utah State University.;
  • 学科 Physics.
  • 学位 Ph.D.
  • 年度 2018
  • 页码 264 p.
  • 总页数 264
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：[email protected]

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号

OSZAR »